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SAE AS6171/2

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SAE AS6171/2 Revision A, May 1, 2017 (R) Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Using SEM Test Methods
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Description / Abstract: This document describes the requirements of the following test methods for counterfeit detection of electronic components

Method A: General EVI, Sample Selection, and Handling

Method B: Detailed EVI, including Part Weight measurement

Method C: Testing for Remarking

Method D: Testing for Resurfacing

Method E: Part Dimensions measurement

Method F: Surface Texture Analysis using SEM

The scope of this document is focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements shall also apply

Purpose

This standard establishes requirements for the inspection process, documentation of results, personnel qualification, and the inspection equipment to be used. It also outlines techniques to detect suspect counterfeit parts by a trained inspector