Description / Abstract:
This document describes the requirements of the following test methods for counterfeit detection of electronic components
Method A: General EVI, Sample Selection, and Handling
Method B: Detailed EVI, including Part Weight measurement
Method C: Testing for Remarking
Method D: Testing for Resurfacing
Method E: Part Dimensions measurement
Method F: Surface Texture Analysis using SEM
The scope of this document is focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements shall also apply
Purpose
This standard establishes requirements for the inspection process, documentation of results, personnel qualification, and the inspection equipment to be used. It also outlines techniques to detect suspect counterfeit parts by a trained inspector